Journal des systèmes biomédicaux et des technologies émergentes

Electrostatically Induced Voltage in Two Metal Cases When a Charged Object Moves Away From and Passes by Cases

Abstract

Norimitsu Ichikawa, Kota Usuki and Fumiya Hatanaka

Electronic device may malfunction owing to electrostatically induced voltages. Malfunctions or failures can occur
because of induced voltages in the range of 10 V. Charged human bodies can occasionally reach as high as 10 kV
in offices. When such an object moves near the metal housing of electronic device, a high induced voltage can
occasionally be generated in the case. In experiments, the induced voltages in two metal cases are measured using
two spark gaps and two electromagnetic wave sensors when the charged object moves away from the metal case
and passes by another case. The results will be helpful in the consideration of preventive measures for electronic
device.