Journal des sciences et de l'ingénierie des matériaux

Effect of Temperature of Electron Beam Evaporated CdSe Thin Films

Abstract

Sahuban Bathusha MS, Chandramohan R, Vijayan TA, Saravana Kumar S, Sri Kumar SR, Ayeshamariam A and Jayachandran M

CdSe thin films were deposited on a glass substrate by using electron beam evaporation technique. The as deposited films were annealed from 100ºC to 300°C with an increment of 100°C. Morphological, structural and optical characterization of the films was carried out by using scanning electron microscope (SEM), X-ray diffraction (XRD), ultraviolet-visible (UV-Vis) spectroscopy; and Fourier transform infrared spectroscopy. The X-ray diffraction pattern that the film has a cubic phase with preferred orientation (100), the grain size was found to be in the range of 29-46 nm. SEM results reveal that film grains are polycrystalline in nature covered the whole surface of the substrate.